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Low-Temperature Relative Reflectivity Measurements of Reflective and Scintillating Foils used in Rare Event Searches

机译:反射和反射的低温相对反射率测量   稀有事件搜索中使用的闪烁箔

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摘要

In this work we investigate the reflectivity of highly reflective multilayerpolymer foils used in the CRESST experiment. The CRESST experiment searchesdirectly for dark matter via operating scintillating CaWO$_4$ crystals astargets for elastic dark matter-nucleon scattering. In order to suppressbackground events, the experiment employs the so-called phonon-light techniquewhich is based on the simultaneous measurement of the heat signal in the mainCaWO$_4$ target crystal and of the emitted scintillation light with a separatecryogenic light detector. Both detectors are surrounded by a highly reflectiveand scintillating multilayer polymer foil to increase the light collectionefficiency and to veto surface backgrounds. While this study is motivated bythe CRESST experiment, the results are also relevant for other rare eventsearches using scintillating cryogenic bolometers in the field of the search ofdark matter and neutrinoless double beta decay ($0\nu\beta\beta$). In this worka dedicated experiment has been set up to determine the relative reflectivityat 300 K and 20 K of three multilayer foils ("VM2000", "VM2002", "Vikuiti")produced by the company 3M. The intensity of a light beam reflected off thefoil is measured with a CCD camera. The ratio of the intensities at 300 K and20 K corresponds to the relative reflectivity change. The measurementsperformed in this work show no significant change in the reflectivity withtemperature for all foils studied.
机译:在这项工作中,我们研究了CRESST实验中使用的高反射多层聚合物箔的反射率。 CRESST实验通过操作闪烁的CaWO $ _4 $晶体作为弹性暗物质-核子散射的目标,直接搜索暗物质。为了抑制背景事件,该实验采用了所谓的声子光技术,该技术基于同时使用独立的低温光探测器对主CaWO_4 $目标晶体中的热信号和发射的闪烁光进行同时测量。两个检测器都被高反射和闪烁的多层聚合物箔包围,以提高光收集效率和否决表面背景。尽管这项研究是由CRESST实验推动的,但该结果也与在暗物质和无中微子双β衰变($ 0 \ nu \ beta \ beta $)搜寻领域中使用闪烁低温辐射热计进行的其他罕见事件研究有关。在这项工作中,已经建立了专门的实验来确定3M公司生产的三种多层箔(“ VM2000”,“ VM2002”,“ Vikuiti”)在300 K和20 K时的相对反射率。用CCD相机测量从箔反射的光束的强度。 300 K和20 K处的强度比对应于相对反射率变化。在这项工作中进行的测量表明,所有研究的箔片的反射率都不会随温度发生明显变化。

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